Indian Journal of Science and Technology

The PDF file you selected should load here if your Web browser has a PDF reader plug-in installed (for example, a recent version of Adobe Acrobat Reader).

If you would like more information about how to print, save, and work with PDFs, Highwire Press provides a helpful Frequently Asked Questions about PDFs.

Alternatively, you can download the PDF file directly to your computer, from where it can be opened using a PDF reader. To download the PDF, click the Download link above.

Fullscreen Fullscreen Off


Test data compression is one of the major challenging tasks in VLSI. This paper targets on Test Data compression by using block based method without any variation in the system performance. Test data sets are separated into five kinds of blocks like whole zeros, whole ones, min zero/min one, max ones and complement blocks. The blocks will be read based on the presence of 0s and 1s. The analysis made in the ISCAS89 benchmark circuit shows that the proposed method is more efficient and more flexible and produces a good compression ratio when compared to the existing methods.

Keywords

Data Compression, Code Based Compression, Min Zero - Min One Test Pattern, Test Patterns.
User