Indian Journal of Science and Technology

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This research has been done to facilitate the industries and researchers with a new concept and emerging trends in the field of non-destructive visual inspections. Visual inspection is a process of determining the degree of deviation from a given set of specifications. And, visual inspection system (VIS) is a method of data acquisition, data analysis, quality control, electrical system control, and process control for a particular product, system or process. The main processes involved in a visual inspection system are: image acquisition, image de-noising, image enhancement, image segmentation, image feature selection and extraction, image classification, feature matching, decision making, display of results, and generation of controlling signals according to set values and parameters. The major challenges were identified while the designing and implementation of VIS are: illumination intensity, illumination angle, camera angle, selection of resolution of camera, selection of type of camera, setting of image acquisition rate, development of segmentation algorithm, and selection of an appropriate image processing techniques for a particular system. According to survey it is found that off line VIS based analysis is mostly being applied to analyze the quality of product. Although, non-conventional methods have got higher popularity than conventional methods but non-conventional methods are generally developed for particular applications and it is not flexible enough to be used for other similar inspections, on the other hand, the conventional methods such as: statistical approach and neural network based approach are reliable, flexible, and generalizable. The main categories of VIS were identified as On Line, Off Line and Real Time Visual Inspection Systems. The main area of VIS applications are: space craft inspection, railway track inspection, road traffic density inspection, rain forecasting, real time monitoring and controlling of automotive vehicles, inspection of turbines, and patient action monitoring.

Keywords

AVIS, CCD, CMOS, SVM, Threshold
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