Asian Journal of Research in Chemistry

Open Access Open Access  Restricted Access Subscription Access
Open Access Open Access Open Access  Restricted Access Restricted Access Subscription Access

Monitoring the Cadmium Sulfide Thin Films by Double-Exposure Holographic Interferometry Technique


Affiliations
1 Holography and Materials Research Laboratory, Dept. of Physics, Shivaji University, Kolhapur-416004, India
     

   Subscribe/Renew Journal


Here, the Double Exposure Holographic Interferometry (DEHI) technique is used to study the surface deformation on stainless steel substrate, when CdS is deposited on it. In the electrodeposition method at different concentrations, CdSO4 is used as cadmium source, while Na2S2O3 is used as a sulphur source and ethylene diamine tetra acetic acid (EDTA) is used as a complexing agent. The electro deposition of CdS thin films is carried out by varying the time of deposition. The deposition potential of the compound was studied by cyclic voltammetry. The structural, surface morphological and optical properties of the deposited films have been studied using X-ray diffraction (XRD), scanning electron microscope (SEM) and optical absorption technique respectively. The DEHI technique is used to determine, thickness of thin film and stress to substrate of electrodeposited CdS thin films for various deposition time and at various concentrations.

Keywords

DEHI Technique, Thin Films, Electrodeposition, CdS, XRD, SEM.
Subscription Login to verify subscription
User
Notifications
Font Size


Abstract Views: 221

PDF Views: 1




  • Monitoring the Cadmium Sulfide Thin Films by Double-Exposure Holographic Interferometry Technique

Abstract Views: 221  |  PDF Views: 1

Authors

S. A. Gangawane
Holography and Materials Research Laboratory, Dept. of Physics, Shivaji University, Kolhapur-416004, India
S. D. Kamat
Holography and Materials Research Laboratory, Dept. of Physics, Shivaji University, Kolhapur-416004, India
V. P. Malekar
Holography and Materials Research Laboratory, Dept. of Physics, Shivaji University, Kolhapur-416004, India
V. J. Fulari
Holography and Materials Research Laboratory, Dept. of Physics, Shivaji University, Kolhapur-416004, India

Abstract


Here, the Double Exposure Holographic Interferometry (DEHI) technique is used to study the surface deformation on stainless steel substrate, when CdS is deposited on it. In the electrodeposition method at different concentrations, CdSO4 is used as cadmium source, while Na2S2O3 is used as a sulphur source and ethylene diamine tetra acetic acid (EDTA) is used as a complexing agent. The electro deposition of CdS thin films is carried out by varying the time of deposition. The deposition potential of the compound was studied by cyclic voltammetry. The structural, surface morphological and optical properties of the deposited films have been studied using X-ray diffraction (XRD), scanning electron microscope (SEM) and optical absorption technique respectively. The DEHI technique is used to determine, thickness of thin film and stress to substrate of electrodeposited CdS thin films for various deposition time and at various concentrations.

Keywords


DEHI Technique, Thin Films, Electrodeposition, CdS, XRD, SEM.