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Ravi, V.
- Built in Self Test Architecture using Concurrent Approach
Abstract Views :180 |
PDF Views:0
Authors
M. Dodiya Chandni
1,
V. Ravi
1
Affiliations
1 School of Electronics Engineering, VIT University, Chennai-600127, Tamil Nadu, IN
1 School of Electronics Engineering, VIT University, Chennai-600127, Tamil Nadu, IN
Source
Indian Journal of Science and Technology, Vol 9, No 20 (2016), Pagination:Abstract
Background/objectives: Built in Self Test Architectures are used for the online or offline testing of the digital circuits and can be operated both in normal as well as test mode. So the objective is to test the circuit under test in online mode with less concurrent test latency and less area overhead. Methods/ Statistical Analysis: In the case of normal mode the time required for testing becomes undesirable parameter so here we prefer offline testing method with concurrent approach which is also monitoring the window at the input by applying input vectors considering circuit under test as most important part of the processor which is arithmetic logic unit. Findings: The particular locations of the input vectors are stored in the latches which worked as the memory elements and this proposed scheme becomes more efficient by using cellular automata as test pattern generation and response analyzer using rule 90. Application/Improvement: The proposed scheme is comparable with the same architecture, considering TPG as LFSR (Linear Feedback Shift Register) and counter.Keywords
Arithmatic Logic Unit, Built in Self Test, Cellular Automata, Concurrent Test Latency, LFSR, Memory Elements, TPG, Windowing.- Design and Development of BIST Architecture for Characterization of S-RAM Stability
Abstract Views :143 |
PDF Views:0
Authors
Affiliations
1 SENSE Department, VIT - Chennai, Vandalur to Kelambakkam Road, Chennai - 600127, Tamil Nadu, IN
1 SENSE Department, VIT - Chennai, Vandalur to Kelambakkam Road, Chennai - 600127, Tamil Nadu, IN
Source
Indian Journal of Science and Technology, Vol 9, No 21 (2016), Pagination:Abstract
Objectives: The objective is to find the optimum SNM of SRAM and then a BIST architecture is designed and implemented to test the SRAM cells varying the voltage of the bit lines. Methods/Analysis: In this paper we use a detection technique which is digitally programmable to detect the defective SRAM cells by using some additional set of SRAM cells to change the bitline voltage and then apply stress to the CUT. Findings: By using this programmable detection technique, cells can be tested even after the fabrication and accordingly one can find out the bit line voltages at which even weak and bad cells can be made useful. Improvement: The main advantage of programmability is that we can maintain considerable tradeoff between test yield and quality. The results at the end will justify the effectiveness of the BIST architectureKeywords
Built in Self Test (BIST), SRAM, Programmable Detection Technique, Static Noise Margin (SNM), Stability.- Video Headend Video Quality Monitoring Solution
Abstract Views :194 |
PDF Views:0
Authors
Affiliations
1 Department of Communication Engineering, SENSE, VIT University, Vellore - 632014, Tamil Nadu, IN
2 Alcatel-Lucent India Limited, Department of Video BU, Chennai - 600096, Tamil Nadu, IN
3 School of Electronics Engineering, VIT University, Vellore - 632014, Tamil Nadu, IN
1 Department of Communication Engineering, SENSE, VIT University, Vellore - 632014, Tamil Nadu, IN
2 Alcatel-Lucent India Limited, Department of Video BU, Chennai - 600096, Tamil Nadu, IN
3 School of Electronics Engineering, VIT University, Vellore - 632014, Tamil Nadu, IN
Source
Indian Journal of Science and Technology, Vol 8, No 19 (2015), Pagination:Abstract
Background: The convergence of traditional Broadcast Television Broadcasting (DVB) services is evolving towards all Internet Protocol (IP) delivery network. In addition, the response to this evolution is the standardization of Internet Protocol Television (IPTV) architectures, such as DVB-IPTV, focusing on the delivery of continuous high-quality video services and covering the natural evolution of services such as high definition television and stereoscopic video. Nevertheless, by using existing video monitoring solution, it cannot be possible to monitor more than one live stream simultaneously without delay and for that setup need many devices. Also it is not feasible to monitor real-time video for IP Headend without storing the content. By creating a centralized monitoring environment one can able to integrate all the headend devices where the operator can identify and rectify errors based on their priority that occurred throughout the network. Methods: The proposed work provides a solution to monitor video without delay and with fewer networks. This Video Quality Monitoring (VQM) Solution deals with real time monitoring of channels effectively and efficiently with the help of network management system. Findings: This project describes the design and functionality of VQM and all streamed channel will be displayed on the video wall with specific parameters of video for subjective monitoring purpose.Keywords
DVB, Headend, IPTV, Monitoring, Quality, Video, VQM- Design of BIST using Self-Checking Circuits for Multipliers
Abstract Views :139 |
PDF Views:0
Authors
Affiliations
1 School of Electronics Engineering, VIT University, Chennai - 600127, Tamil Nadu, IN
1 School of Electronics Engineering, VIT University, Chennai - 600127, Tamil Nadu, IN
Source
Indian Journal of Science and Technology, Vol 8, No 19 (2015), Pagination:Abstract
Background: Current technologies results in gradual increase in sensitiveness towards faults causing malfunctioning of the circuit. This paper presents the novel design of Built-In-Self-Test (BIST) using self-checking circuits for bit array multipliers. Methods: The design of BIST comprises of self-checking full adder which ensures fault detection on the same chip area. Each regular full adders and half adders in bit array multipliers are replaced by self-checking full adder so that any transient or permanent faults can be detected and recovered. The proposed BIST design also allows power saving procedures in Power Efficient-Test Pattern Generator (PE-TPG). Findings: Simulation results shows that implementation of this self-checking full adder into standard bit array multiplier minimizes the area overhead and power consumption by 25%-30% as compared to previous self-checking designs. The proposed BIST can handle up to ten faults with 70% probability of error detection, which is higher than earlier Double Modular Redundancy (DMR) as well as Triple Modular Redundancy (TMR) technique with handling of six faults with 60% error detection probability. Conclusion: The proposed BIST design forms the base of area and power efficient testing methodologies for digital circuits. The architecture of BIST can be modified according to the data path of multiplier under test.Keywords
Built-In-Self-Test (BIST), Fault Detection, Self Checking, Stuck-at Fault, Test Pattern Generation (TPG)- Implementation of Health Monitoring System using Mixed Environment
Abstract Views :202 |
PDF Views:0
Authors
Neha Sinha
1,
V. Ravi
1
Affiliations
1 School of Electronics Engineering, VIT University, Chennai-600127, Tamil Nadu, IN
1 School of Electronics Engineering, VIT University, Chennai-600127, Tamil Nadu, IN