R. Praveen kumar ¹, M. Sasikumar ¹, S. Dinesh Kumar ²

Affiliations
1 School of Mechanical and Building Sciences (SMBS), VIT University, Chennai Campus, Chennai – 600127, Tamil Nadu, IN
2 Department of Automobile Engineering, Karpaga Vinayaga College of Engineering and Technology, Chennai - 600024, Tamil Nadu, IN

Abstract

Objective: The main aim of this paper is redesigning Muffler internal layout to improve the attenuation based on the critical parameters. Analyzing the baseline muffler design, the area of improvement is identified as frequency range of 250Hz–800Hz. Methods: By keeping t h e volume of muffler constant and varying the critical parameters such as perforation size, length of perforations on the pipe, length of intermediate pipes and the position of baffles thirty iterations were performed. Finding: The exhaust gas flow path was modified in the new concept for better attenuation. Second and fourth chambers were made as expansion chambers. First and third chambers were made as Helmholtz chambers. With this basic flow path, further fine tuning was done by varying the critical parameters. Applications: With this current design and optimistic characteristic, the candidate’s muffler design can be used as noise reduction muffler in automobile industries.

Keywords

Acoustics, Muffler, Sensitivity Analysis, Transmission Loss.

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K. Poornima ¹, K. Gopala Krishnan ¹, S. Dinesh Kumar ²

Affiliations
1 Department of Electronics, S.N.R. Sons College, Coimbatore - 641006, Tamil Nadu, IN
2 Department of Physics, Government Arts College, Udhagamandalam - 643 002, Tamil Nadu, IN

Abstract

Objectives: Transparent Zinc oxide (ZnO) thin films to be prepared and annealed on the Indium tin oxide - ITO substrate using simple solution gel dip coating technique. Methods/Analysis: Thin films have been carried out by different characterization techniques such as X-ray diffractometer - XRD, Scanning Electron Microscopy - SEM, Energy dispersive analysis - EDAX, UV spectroscopic and FTIR spectroscopy. In the contemporary work, the ZnO films have been prepared on ITO substrate by dipping in the solution and annealed at the 300 °C. Findings: XRD pattern reveals that the annealed thin film is standard wurtzite zinc oxide hexagonal structure. SEM Morphological studies have been investigated using scanning electron microscopy and the elemental analysis confirmed by EDAX. Optical measurement shows the greatly transparent and the thin films are direct energy gap Eg of 3.70eV. FTIR confirm the metal oxide bond in the molecular structure. Novelty/Improvement: This research work helps for the future researcher’s preparation of undoped Zinc oxide thin film for solar cell applications.

Keywords

ITO Substrate, Sol-Gel Method, ZnO Thin Film

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