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Sreenivasulu, G.
- Improving Channel Capacity in Wireless Network by Mitigating Co-Channel Interference and Channel Fading Effects
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Authors
Affiliations
1 Sathyabama University, Chennai, IN
2 Department of ECE, S.V. University, Tirupati, IN
1 Sathyabama University, Chennai, IN
2 Department of ECE, S.V. University, Tirupati, IN
Source
Wireless Communication, Vol 2, No 8 (2010), Pagination: 245-250Abstract
In this paper, techniques for increasing the capacity of a wireless system are described. The performance of different diversity schemes used to mitigate the fading effects is studied. It is also presented in this work, that apart from diversity combiners, the choice of modulation also has varying effects on fading mitigation. The effect of co-channel interference and channel fading on the data bits transmitted is considered. A practical requirement such as, that, systems must also have full-duplex provision, is taken care in this work. It is presented in this work, that the effects of flat fading may be reduced using diversity techniques.Keywords
Fading, Co-Channel Interference (CCI), Adjacent Channel Interference (ACI), Outage Probability, Cell Splitting.- Design and Development of an Embedded System for the Measurement of Boltzmann’s Constant
Abstract Views :158 |
PDF Views:0
Authors
Affiliations
1 Department of Physics, Sri Krishnadevaraya University, Ananthapuramu - 515003, Andhra Pradesh, IN
1 Department of Physics, Sri Krishnadevaraya University, Ananthapuramu - 515003, Andhra Pradesh, IN
Source
Indian Journal of Science and Technology, Vol 9, No 39 (2016), Pagination:Abstract
Objectives: In this paper we present the design and development of an embedded system for the measurement of Boltzmann’s constant using Texas Instruments’ microcontroller: MSP430G2553. Methods/ Statistical Analysis: A transistor connected in common-base configuration with collector and base maintained at the same voltage (known as diode connected transistor or Transdiode) is used as the Device Under Test (DUT). The base-emitter voltage (VBE) is varied by a stepper motorized potentiometer whose rotation is controlled by microcontroller. The collector current (IC) is measured by converting it into voltage (V) by I-to-V converter using operational amplifier. The temperature of the bath where DUT is placed is measured using LM35 temperature sensor. The base-emitter voltage VBE, collector current IC and temperature in Kelvin T are measured using MSP430G2553 microcontroller. The data is captured using terminal software PuTTY. These files are imported to the scientific graph plotting software Origin. The graphs are drawn between natural log values of IC versus VBE at ambient temperature. To perform the measurement at different temperatures a heater system with constant current source is designed and constructed in the laboratory. Findings: From the slope of ln(IC) versus VBE graph Boltzmann’s constant is calculated. The values of Boltzmann’s constant at different temperatures are averaged and compared with standard CODATA (2014) value and percentage of error is determined. Application/Improvement: Microcontroller based embedded system for the measurement of Boltzmann’s constant is rarely seen in literature. In the present work, a fully automatic electronic circuit for the estimation of Boltzmann’s constant is designed and developed. The system is built around Texas Instruments’ MSP430G2553 microcontroller and cost-effective, off-the-shelf components are used in the circuit construction.Keywords
Boltzmann’s Constant, Diode Connected Transistor, Energia, Embedded System, MSP430G2553 Microcontroller, PuTTY, Transdiode.- Design and Development of Linear Velocity Measurement System using Texas Instruments Hall Effect Sensor DRV5023-Q1 and Microcontroller MSP430G2553
Abstract Views :110 |
PDF Views:0
Authors
Affiliations
1 Department of Physics, Sri Krishnadevaraya University, NH - 205, Anantapur - Tirupati Highway, Anantapuram - 515003, Andhra Pradesh, IN
1 Department of Physics, Sri Krishnadevaraya University, NH - 205, Anantapur - Tirupati Highway, Anantapuram - 515003, Andhra Pradesh, IN
Source
Indian Journal of Science and Technology, Vol 9, No 38 (2016), Pagination:Abstract
Objectives: Angular and linear velocity measurements play an important role in monitoring and controlling the speed of motors used in applications such as conveyors, turbines, robots, automobiles and other moving objects. In the present paper, an inexpensive and portable system for the measurement of rotations per minute (RPM), linear and angular velocities is developed using Texas Instruments Hall effect sensor: DRV5023-Q1 and microcontroller MSP430G2553. Methods/Statistical Analysis: A unipolar Hall sensor switch produces pulses when a tiny magnet is brought in its vicinity. These pulses are counted by using the microcontroller in a fixed time interval and number of pulses per second gives frequency or rotations per second (RPS). From frequency, RPM, angular and linear velocities are computed. Findings: The measured parameters are displayed on LCD. The experimental frequencies are compared with the frequencies measured using commercial frequency meter (PHILIPS PM6624D). The linearity in velocity measurement (RPM) is represented in the form of a graph. Application/Improvement: In the present work an inexpensive and robust system is designed and developed for the linear velocity measurement. Further, the system is portable and works on a single rechargeable 9V battery. Such systems can be used in complex environment also.Keywords
Hall Effect Sensor, Linear Velocity, MSP430G2553, RPM, Tachometer.- Coastal Morphodynamics of Tupilipalem Coast, Andhra Pradesh, Southeast Coast of India
Abstract Views :134 |
PDF Views:37
Authors
G. Sreenivasulu
1,
N. Jayaraju
1,
B. C. Sundara Raja Reddy
2,
T. Lakshmi Prasad
3,
B. Lakshmanna
1,
K. Nagalakshmi
3
Affiliations
1 Department of Geology, Yogi Vemana University, Kadapa 516 003, IN
2 Department of Geology, Sri Venkateswara University, Tirupati 517 502, IN
3 Department of Earth Sciences, Yogi Vemana University, Kadapa 516 003, IN
1 Department of Geology, Yogi Vemana University, Kadapa 516 003, IN
2 Department of Geology, Sri Venkateswara University, Tirupati 517 502, IN
3 Department of Earth Sciences, Yogi Vemana University, Kadapa 516 003, IN