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Bait-Suwailam, M. M.
- What Causes to Tune a Condition of Exactly Identical Fault-Masks Behaviors in an LFSR based BIST Methodology
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Authors
Affiliations
1 Department of Electrical and Computer Engineering, College of Engineering, Sultan Qaboos University, Muscat, OM
1 Department of Electrical and Computer Engineering, College of Engineering, Sultan Qaboos University, Muscat, OM
Source
Oriental Journal of Computer Science and Technology, Vol 10, No 4 (2017), Pagination: 710-717Abstract
The authors show that in a Built-In Self-Test (BIST) technique, based on linear-feedback shift registers, when the feedback connections in pseudo-random test-sequence generator and signature analyzer are images of each other and corresponds to primitive characteristic polynomial then behaviors of faults masking remains identical. The simulation results of single stuck-at faults show how the use of such feedback connections in pseudo-random test-sequence generator and signature analyzer yields to mask the same faults.Keywords
Linear Feedback Shift Register, Characteristic Polynomial, Test Pattern, Built–In Self-Test, Pseudo- Random Test Sequence Generators, Signature Analyzer.Full Text
References
- A. Ahmad, A. and A. H. Al-Habsi, A. H. “Design of a built-in multi-mode ICs tester with higher testability features- A most suitable testing tool for BIST environment”, Taylor & Francis online, pp. 283-288, 2015. http://www.tandfonline.com/loi/titr20
- A. Ahmad, D. Al-Abri, “Design of an optimal test simulator for Built-In Self-Test environment”, The Journal of Engineering Research, vol. 7, no. 2, pp. 69 – 79, 2010
- A. Ahmad, A. and A. Al-Habsi, “Design of a built-in multi-mode ICs tester with higher testability features- A most suitable testing tool for BIST environment”, IETE Technical Review, vol. 15, no. 3, pp. 283 – 288, 1998.
- A. Ahmad, “Achievement of higher testability goals through the modification of shift register in LFSR based testing,” International Journal of Electronics, vol. 82, no. 3, pp. 249-260, 1997.
- N. K. Nanda, A. Ahmad and V. C. Gaindhar V.C., “Shift register modification for multipurpose use in combinational circuit testing”, International Journal of Electronics, vol. 66, no. 6, pp. 875 – 878, 1989.
- E. J. McCluskey, "Built-In Self-Test Techniques", IEEE Design & Test of Computers, Vol. 2, No. 2, April 1985, pp. 21-28.
- A. Ahmad, A. and L. Hayat, "On design of 16-bit signature analyzer circuits equipped with primitive characteristic polynomials", Proc. IEEE 1st Taibah University International Conference on Computing and Information Technology, ICCIT 2012, pp. 660 – 664
- A. Ahmad, A., “On Design of 8-Bit CRC Circuits Equipped with Primitive Characteristic Polynomials”, Proc. IEEE International Conference on Multimedia, Signal Processing and Communication Technologies (IMPACT-2011), pp. 63 – 67.
- A. Ahmad, A. and L. Hayat, “Selection of Polynomials for Cyclic Redundancy Check for the use of High Speed Embedded – An Algorithmic Procedure”, Transactions on Computers (WSEAS), vol. 10, no. 1, pp. 16 – 20, 2011.
- A. Ahmad, A., “Investigation of Some Quite Interesting Divisibility Situations in a Signature Analyzer Implementation”, Transactions on Circuits and Systems (WSEAS), vol. 10, no. 9, pp. 299 – 308, 2011
- A. Ahmad A., “Critical role of polynomial seeds on the effectiveness of an LFSR-based testing technique”, International Journal of Electronics, vol.77, no.2, pp.127 – 137, 1994.
- A. Ahmad, A. and J. Al-Balushi, “How to Design an Effective Serial Input Shift Register (SISR) for Data Compression Process of Built-In Self-Test Methodology” Proc. IEEE 4th International Design and Test Workshop (IDT'09), pp. 372 – 379.
- A. Ahmad, "Constant error masking behavior of an internal XOR type signature analyzer due to the changed polynomial seeds,” Computers & Electrical Engineering, vol. 28, no. 6, pp. 577 - 585, 2002.
- A. Ahmad, A., “Investigation of a constant behavior aliasing errors in signature analysis due to the use of different ordered test-patterns in a BIST testing techniques”, Microelectronics and Reliability, vol. 42, pp. 967 – 974, 2002.
- T.W. Williams, W. Daehn, M. Gruetzner and C.W Starke, "Bounds and Analysis of Aliasing Errors in Linear Feedback Shift Registers", IEEE Trans. Computer Aided-Design, Vol. CAD-7 No. 1, Jan. 1988, pp. 75-83.
- Ahmad A. and Nanda N.K., “Effectiveness of multiple compressions of multiple signatures”, International Journal of Electronics, vol. 66, no. 5, pp. 775 – 787, 1989.
- A. Ahmad, N. K. Nanda and K. Garg, “The use of irreducible characteristic polynomials in an LFSR based testing of digital circuits”, Proc. of 4th IEEE int’l conference (TENCON-89), pp. 494 – 496.
- J. P. Robinson and N. R. Saxena, "Simultaneous Signature and Syndrome Compression", IEEE Trans. Computer Aided Design, Vol. CAD-7, No. 5, May 1988, pp. 589-594.
- S. Z. Hassan and E. J. McCluskey, "Increased Fault-Coverage through Multiple Signatures", Proc. 14th Int’l Symposium - Fault-Tolerant Computing (FTCS-14), 1984, pp. 354-359.
- A. Ahmad and A. M. Elabdalla, “An efficient method to determine linear feedback connections in shift registers that generate maximal length pseudo-random up and down binary sequences”, Computer & Electrical Engineering, vol. 23, no. 1, pp. 33-39, 1997.
- A. Ahmad, N. K. Nanda and K. Garg, “Are primitive polynomials always best in signature analysis?” IEEE design & Test of Computers, vol.7, no.4, pp. 36 – 38,1990.
- A. Ahmad, N. K. Nanda and K. Garg, “A critical role of primitive polynomials in an LFSR based testing technique”, IEE Electronics Letters, vol. 24, no.15, pp. 953 – 955, 1988.