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Padte, J. C.
- Enhancing Dimensional Measurement Resolution and Accuracy in Machine Vision Inspection with Sub-Pixel Measurement Technique
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1 Mechasoft, Ichalkaranji, IN
2 Fie Research Institute, Ichalkaranji, IN
1 Mechasoft, Ichalkaranji, IN
2 Fie Research Institute, Ichalkaranji, IN