International Journal of Innovative Research and Development

Abstract

Images acquired through modern sensors may be contaminated by a variety of noise sources. Noise refers to stochastic variations as opposed to deterministic distortions such as shading or lack of focus. It was assumed for this section that we are dealing with images formed from light using modern electro optics. In this paper, a wavelet-based multi-scale peak signal to noise ratio (PSNR) scheme for image de-noising is proposed, and the determination of the wavelet basis with respect to the proposed scheme is also discussed. Compared to other wavelet-based representation the proposed Moving window based wavelet shrinkage based method is more efficient for a wide range of contour features such as junctions, corners and ridges, especially at low bit rates.

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