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International Journal of Innovative Research and Development, Vol 1, No 7Sp (2012), Pagination: 73-82
Abstract
Group II-VI materials of periodic table are very suitable for electronics and optoelectronics application. A multilayer thin film is prepared on a chemically cleaned glass substrate by depositing CdS, CdTe, CdSe and ZnSe one after another using Thermal Evaporation Method. The vacuum inside thin film coating unit is maintained at 10-6mbar. The electrical properties of this multilayered thin film have been investigated. The crystal structure and lattice parameter of individual and multilayered film are determined by X-ray diffractograms. The surface morphology of individual film was investigated by SEM analysis.
Keywords
Thin Film, X-ray Diffractogram, SEM
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