Efficient Error Detection And Correction For Memory Applications Using Majority Logic Decoder And Detection

Memory is a basic resource in every digital systems but nowadays, single event upsets (SEU) altering these memories by changing its states which is caused by ions or electro-magnetic radiations. Error-correcting code memory (ECC memory) is a type of computer data storage that can detect and correct the more common kinds of internal data corruption. This paper presents an error detection and correction method for Euclidean geometry Low density parity check (EG-LDPC) codes with majority logic decoding. Here the application is mainly focused on memories, since MLDD is used here due to its capability of correcting large errors. Even though they require a large decoding time that will more affecting on memory performance. This can be overcome by the proposed technique which significantly reduces memory access time and also it take three iterations instead of N iterations when there is no error in the data read and it uses majority logic decoder itself to detect failures which minimizes the area and power consumption.