Digital Signal Processing

B. Lakshmi ¹, R. Arunprasath ²

Affiliations
1 Department of VLSI, Anna University, Regional Office, Madurai, IN
2 Anna University Regional Office, Madurai, IN

Abstract

To prevent soft errors from causing data corruption, memories are typically protected with error correction codes. An advanced error correction codes are used when an additional protection is needed. The majority logic decoder/detector codes are used for memory application because of correcting large number of soft errors, less decoding time, area consumption. The EG-LDPC codes are suitable for error correction using majority logic decoder/detector. Because the EG-LDPC codes are small, powerful and easily implemented in terms of decoding latency and complexity and this design achieving very high data rate while minimizing complexity. The proposed improved majority logic decoder/detector to perform silent data error detection in simple way using additional error detection technique and also reducing the area of the majority gate using sorting network. Hence the decoding process uses less number of cycles, reduces the area and also reducing the power consumption.

Keywords

EG-LDPC Code, Error Correction Codes, Majoritylogic Decoding, Memory.

Full Text

     

K. R. Vishnupriya ¹, B. Lakshmi ², R. Srinivasan ²

Affiliations
1 Department of Information Technology in SSN College of Engineering, Kalavakkam – 603 110, Chennai, Tamilnadu, IN
2 Department of Information Technology in SSN College of Engineering, Kalavakkam – 603 110, Chennai, Tamilnadu, IN

Abstract

This paper investigates the effect of process variations on unity gain frequency (ft) in 30 nm gate length FinFET by performing extensive TCAD simulations. Six different geometrical parameters, channel doping, source/drain doping and gate electrode work function are studied for their sensitivity on ft. It is found that ft is more sensitive to gate length, underlap, gate-oxide thickness and SD doping and less sensitive to source/drain width and length, and work function variations.

Keywords

f_t, FinFET, Scaling, Process Variations.

Full Text