Refine your search
Collections
Co-Authors
Year
A B C D E F G H I J K L M N O P Q R S T U V W X Y Z All
Laxmi Prasanna, V.
- New Analytical Methods in Nanotechnology-A Review
Abstract Views :458 |
PDF Views:83
Authors
Affiliations
1 Nalanda College of Pharmacy, Nalgonda, Andhra Pradesh-5008001
2 Nalanda College of Pharmacy, Nalgonda, Andhra Pradesh-5008001, IN
1 Nalanda College of Pharmacy, Nalgonda, Andhra Pradesh-5008001
2 Nalanda College of Pharmacy, Nalgonda, Andhra Pradesh-5008001, IN
Source
Asian Journal of Research in Pharmaceutical Sciences, Vol 3, No 1 (2013), Pagination: 31-41Abstract
Nanotechnology may be able to create many new materials and devices with a vast range of applications, such as in medicine, electronics, biomaterials and energy production. On the other hand, nanotechnology raises many of the same issues as any new technology, including concerns about the nanotoxicity and environmental impact of nano materials, and their potential effects on global economics. Like electricity or computers before it, nanotech will offer greatly improved efficiency in almost every facet of life. But as a general-purpose technology, it will be dual-use, meaning it will have many commercial uses and it also will have many military uses making far more power -full weapons and tools of surveillance. Thus it represents not only wonderful benefits for Humanity, but also grave risks. A key understanding of nanotechnology is that it offers not just better products, but a vastly improved manufacturing process. A computer can make copies of data files—essentially as many copies as you want at little or no cost. It may be only a matter of time until the building of products becomes as cheap as the copying of files. That's the real meaning of nanotechnology and why it is sometimes seen as "the next industrial revolution." Generally, nanotechnology deals with developing materials, devices, or other structures possessing at least one dimension sized from 1 to 100 nanometers. Quantum mechanical effects are important at this quantum-realm scale. In this project a discussion about each method and its principle, applications, and limitations are done in details. These techniques are discussed in detailed further. Applications for the future: Efficient and energy-saving Cube-shaped nanostructures known as metal organic frameworks (MOFs) are the storage medium of the future.Keywords
Nanotechnology, Analysis, Contamination, Characterization, Composition.
References
- B. K. Vainshtein, Structure Analysis by Electron Diffraction, Pergamon Press, Oxford (1964).
- Ultraviolet microscope. (2010). In Encyclopædia Britannica. Retrieved November 20, 2010, from Encyclopedia Britannica Online
- Ruska, translation my T Mulvey. The Early Development of Electron Lenses and Electron Microscopy. ISBN 3-7776-0364-3.
- Williams, D and Carter, C. B. (1996). Transmission Electron Microscopy. 1 - Basics. Plenum Press. ISBN 0-306-45324-X.
- Champness, P. E. (2001). Electron Diffraction in the Transmission Electron Microscope. Garland Science. ISBN 1859961479. ISSN 978-1859961476.
- Crewe, Albert V; Isaacson, M. and Johnson, D. (1969). "A Simple Scanning Electron Microscope". Rev. Sci. Inst. 40 (2): 241
- Broglie, L. (1928). "La nouvelle dynamique des quanta". Électrons et Photons: Rapports et Discussions du Cinquième Conseil de Physique. Solvay.
- Rose, H H (2008). "Optics of high-performance electron Microscopes" (free download review on electron optics). Science and Technology of Advanced Materials 9: 014107. Bibcode2008STAdM...9a4107R. doi:10.1088/0031- 8949/9/1/014107.
- D. Briggs and M. Seah, Practical surface analysis, John Wiley and Sons (1990)
- Electron Spectroscopy for Atoms, Molecules and Condensed Matter, Nobel Lecture, December 8, 1981
- Turner, D. W.; Jobory, M. I. Al (1962). "Determination of Ionization Potentials by Photoelectron Energy Measurement". The Journal of Chemical Physics 37 (12): 3007
- Siegbahn, K.; Edvarson, K. I. Al (1956). "-Ray spectroscopy in the precision range of 1 : 1e6". Nuclear Physics 1 (8): 137– 159. doi:10.1016/S0029-5582(56)80022-9.
- Electron Spectroscopy for Atoms, Molecules and Condensed Matter, Nobel Lecture, December 8, 1981
- Azároff, L. V.; R. Kaplow, N. Kato, R.J. Weiss, A.J.C. Wilson, R.A. Young (1974). X-ray diffraction. McGraw-Hill.
- Stanford EMSI Science Teachers Workshop – July 2006: XRD Tutorial and Demonstration.
- C. Lingk, M. E. Gross, W. L. Brown, X-ray diffraction pole figure evidence for (111) sidewall texture of electroplated Cu in submicron damascene trenches, Appl. Phys. Lett. 74 (1994)
- M. Birkholz, C. Genzel, T. Jung, X-ray diffraction study on residual stress and preferred orientation in thin titanium films
- Good Reference: J.I. Goldstein, D.E. Newbury, D.C. Joy, C.E. Lyman, P. Echlin, E. Lifshin, L.C. Sawyer and J.R. Michael (2003) Scanning Electron Microscopy and X-ray Microanalysis, 3rd Ed., Springer: New York, 689 p.
- Stanford EMSI Science Teachers Workshop – July 2006: XRD Tutorial and Demonstration
- Cazaux, Jacques (December 1992). "Mechanisms of charging in electron spectroscopy". Journal of Electronic Spectroscopy and Related Phenomena 105 (2–3): 155–185. doi:10.1016/S0368- 2048(99)00068-7.
- Went, M.R.; M. Vos and A.S. Kheifets (November 2006). "Satellite structure in Auger and (e,2e) spectra of germanium". Radiation Physics and Chemistry 75 (11): 1698- 1703. Bibcode2006RaPC...75.1698W. doi:10.1016/j.radphyschem.2006.09.003.