Manufacturing Technology Today

Rina Sharma ¹, Usha Kiran ¹, V. N. Ojha ¹, Anil Kumar ¹

Affiliations
1 National Physical Laboratory (CSIR), New Delhi-110012, IN

Abstract

The surface quality of mass standards is on important parameter. Surface roughness of moss standards is important as it is known to be related to contamination with pollutants (such as adsorbed water vapors etc.) and the stability of moss standards. There is a growing interest in surface roughness measurement among mass metrologist. In the present paper we present the work carried out to investigate the roughness of mass standards and try to correlate it with stability of mass standards.

Keywords

Roughness, Mass Standards, White Light Interferometry.

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Nidhi Paliwal ¹, Rina Sharma ¹, Mahesh Chand ¹, V. N. Ojha ¹

Affiliations
1 National Physical Laboratory (CSIR), Dr K. S. Krishnan Marg, New Delhi, IN

Abstract

In the present paper we report crystal surface preparation and analysis of optical surface finish of the Lithium Niobate (LiNbO3) crystal. For preparation of crystals fine abrasive powders (aluminum oxide) of different grain size were used in smoothing and polishing processes. Surface characterization was carried out by imaging the crystal surface with traceable optical profiler in vertical scanning interferometry at magnification objective 2.5X with VisionTM software. The analysis of surface roughness using power spectral density (PSD) function has been carried out and an attempt has been made to correlate PSD analysis with roughness profiles of optical surfaces.

Keywords

Traceable, Abrasive, PSD.

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